Wafer aie appearance inspection machine

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Wafer aie appearance inspection machine
  • Product description
  • Specifications

    Features: 

    » The equipment includes oscillating disk feeding, electrostatic treatment system, glass rotating platform, sensor displacement sensing, upper and lower dual CCD appearance inspection, high-frequency blowing and blanking and other functions; » Low misjudgment rate, P-side misjudgment rate ≤ 0.3 
    % , N-side misjudgment rate≤0.7%, comprehensive misjudgment rate≤1% (output rate=1-defective rate-misjudgment rate);
    » Fast visual detection efficiency, UPH≥100K/H;
    » Exposure light source uses blue light, No harm to human eyes;
    » High-speed CCD processing system;
    » High-precision DD motor rotary platform;
    » Full Chinese operation interface, intuitive operation, simple and good interface;

     

     

     

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